Fine Pitch Probe
Wafer-level RF test probe. Inequality signs are reproduced as published and should be confirmed with LEENO before design-in.
| Parameter | Specification |
|---|---|
| Barrel diameter | ≥75 µm |
| Probe length | ≥2.00 mm |
| Spring force | ≥3.00 g, customized |
| Frequency | ≥50 GHz |
Who manufactures Fine Pitch Probe?
Leeno Industrial presents this product in its official catalog. Review the linked source and confirm the current model, configuration, manufacturing site and supply terms for your order.
How do I confirm the right specification?
Compare your application against the published parameters above. Share the required dimensions, materials, performance conditions, quantity and destination with Prospera. A published range does not confirm that every configuration is available.
Discuss this product →Official source
Leeno Industrial product information ↗.
Independent sourcing information supported by Prospera. Specifications describe the reviewed source, not a guaranteed quotation or certification for your project.