Electronics & semiconductor
Leeno Industrial
Fine Pitch Probe · IC test sockets · Spring contact probes
Products and specifications
Electronics & semiconductor
Fine Pitch Probe
Wafer-level RF test probe. Inequality signs are reproduced as published and should be confirmed with LEENO before design-in.
| Parameter | Specification |
|---|---|
| Barrel diameter | ≥75 µm |
| Probe length | ≥2.00 mm |
| Spring force | ≥3.00 g, customized |
| Frequency | ≥50 GHz |
Electronics & semiconductor
IC test sockets
Product family identified on the company’s official website.
Request a model-specific datasheet for dimensions and performance values.
Explore this product → · Official product source ↗Electronics & semiconductor
Spring contact probes
Product family identified on the company’s official website.
Request a model-specific datasheet for dimensions and performance values.
Explore this product → · Official product source ↗Product catalog
Explore the manufacturer’s product pages and request the current model-specific datasheet.
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